TY  - GEN
AU  - Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.
TI  - Digital Systems Testing and Testable Design
T2  - 24337
SN  - 8172248911
U1  - 621.3815 
PY  - 2001///
CY  - New Delhi
PB  - Jaico Publication
KW  - Digital Systems Testing
ER  -