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Digital Systems Testing and Testable Design
Series: 24337Publication details: New Delhi Jaico Publication 2001Edition: 1edDescription: 652p. Rs:495ISBN:- 8172248911
- 621.3815
| Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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MAMCET. Central Library Electronic Communication Engineering | MAMCET. Central Library Electronic Communication Engineering | ECE | 621.3815 (Browse shelf(Opens below)) | Available | 24337 |
Total holds: 0
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| 621.3815 Digital Electronics | 621.3815 Chip design for submicron VLSI : CMOS layout and Simulation | 621.3815 Introduction to VLSI Design | 621.3815 Digital Systems Testing and Testable Design | 621.3815 Digital Electronics | 621.3815 Digital Electronics | 621.3815 Digital Electronics |
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